Brief Biography
Dr. Xin Tang received his Ph.D. degree in Control Science and Engineering from Donghua University. He joined Shanghai University of Engineering Science in June 2024 as a lecturer. He has presided over a youth project from the Shanghai Natural Science Foundation and several enterprise-commissioned projects, in addition to participating in numerous national and provincial-level research grants. As the first or corresponding author, he has published over 10 SCI-indexed papers, received a Second Prize for the Shanghai Science and Technology Progress Award, and holds two authorized invention patents. Our research group always welcomes students passionate about precision instrument R&D, hardware control, and C++ programming to apply for our Master's program.
Research Interests
- Interferometric Metrology
- Optical Ultra-Precision Measurement
- Digital Image Processing
- Semiconductor Front-End Process Metrology Equipment
- Advanced Optical Characterization & Interfacial Physicochemistry
- Advanced Spectroscopic Ellipsometry in Functional Materials
Research Highlights
Focus Prediction and Uncertainty Modeling Empowered by Deep Learning
This research introduces an innovative deep learning framework that not only accurately predicts the focal position in defocused images but, more critically, quantifies the uncertainty of its predictions. This enhances the reliability and robustness of automated optical inspection and imaging systems.
Single-Frame Interferometric Wavefront Reconstruction via Bayesian Neural Networks
This study leverages Bayesian Convolutional Neural Networks (BNN) to achieve high-precision, reliable reconstruction of complex wavefronts from a single-frame lateral shearing interferogram, offering a robust solution for transient wavefront sensing in dynamic processes.
More coming soon...